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Simple digital only test approach for embedded charge-pump phase-locked loops.

Burbidge, M. and Richardson, Andrew M. D. (2001) Simple digital only test approach for embedded charge-pump phase-locked loops. IEE Electronics Letters, 37 (22). pp. 1318-1319. ISSN 0013-5194

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    Abstract

    Techniques for a simple automated test approach for high performance fully embedded charge-pump phase-locked loops (CP-PLLs) are explained. The test approach is focused towards non-invasive high volume production testing of PLLs using digital only testers in conjunction with additional on-chip circuitry

    Item Type: Article
    Journal or Publication Title: IEE Electronics Letters
    Additional Information: "©2001 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE." "This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder."
    Subjects: T Technology > TA Engineering (General). Civil engineering (General)
    Departments: Faculty of Science and Technology > Engineering
    ID Code: 20242
    Deposited By: ep_ss_importer
    Deposited On: 19 Dec 2008 14:16
    Refereed?: No
    Published?: Published
    Last Modified: 24 Jan 2014 05:15
    Identification Number:
    URI: http://eprints.lancs.ac.uk/id/eprint/20242

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