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Flexible embedded test solution for high-speed analogue front-end architectures.

Lechner, A. and Burbidge, Martin J. and Richardson, Andrew M. D. (2004) Flexible embedded test solution for high-speed analogue front-end architectures. IEE Proceedings - Circuits, Devices and Systems, 151 (4). pp. 359-369. ISSN 1350-2409

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    Abstract

    A flexible embedded test solution for high-speed analogue front-end subsystems is presented. A novel concept of a flexible test solution that addresses virtual component test requirements in particular is introduced. The integration and application of the non-invasive digital test solution is demonstrated for a representative design. Its area overhead is assessed for different depths in on-chip test evaluation.

    Item Type: Article
    Journal or Publication Title: IEE Proceedings - Circuits, Devices and Systems
    Additional Information: "©2004 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE." "This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder."
    Subjects: T Technology > TA Engineering (General). Civil engineering (General)
    Departments: Faculty of Science and Technology > Engineering
    ID Code: 20121
    Deposited By: ep_ss_importer
    Deposited On: 10 Dec 2008 16:56
    Refereed?: No
    Published?: Published
    Last Modified: 24 Jan 2014 05:14
    Identification Number:
    URI: http://eprints.lancs.ac.uk/id/eprint/20121

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