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Radiation-induced statistical uncertainty in the threshold voltage measurement of MOSFET dosimeters.

Benson, Chris and Price, Robert A. and Silvie, Jon and Jaksic, Aleksandar and Joyce, Malcolm J. (2004) Radiation-induced statistical uncertainty in the threshold voltage measurement of MOSFET dosimeters. Physics in Medicine and Biology, 49 (14). pp. 3145-3159. ISSN 0031-9155

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Abstract

The results of a recent study on the limiting uncertainties in the measurement of photon radiation dose with MOSFET dosimeters are reported. The statistical uncertainty in dose measurement from a single device has been measured before and after irradiation. The resulting increase in 1/f noise with radiation dose has been investigated via various analytical models. The limit of uncertainty in the ubiquitous linear trend of threshold voltage with dose has been measured and compared to two nonlinear models. Inter-device uncertainty has been investigated in a group of 40 devices, and preliminary evidence for kurtosis and skewness in the distributions for devices without external bias has been observed.

Item Type: Article
Journal or Publication Title: Physics in Medicine and Biology
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
Departments: Faculty of Science and Technology > Engineering
ID Code: 20106
Deposited By: ep_ss_importer
Deposited On: 10 Dec 2008 15:21
Refereed?: No
Published?: Published
Last Modified: 24 Jan 2014 05:14
Identification Number:
URI: http://eprints.lancs.ac.uk/id/eprint/20106

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