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A multi-frequency impedance analyser for electrical tomography systems.

Yin, W. and Dickinson, S. J. and Peyton, A. J. (2005) A multi-frequency impedance analyser for electrical tomography systems. In: Proceedings of the 4th world congress on industrial process tomography. , pp. 30-35.

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Item Type: Contribution in Book/Report/Proceedings
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
Departments: Faculty of Science and Technology > Engineering
ID Code: 20098
Deposited By: ep_ss_importer
Deposited On: 10 Dec 2008 11:42
Refereed?: No
Published?: Published
Last Modified: 17 Sep 2013 18:17
Identification Number:
URI: http://eprints.lancs.ac.uk/id/eprint/20098

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