A multi-frequency impedance analyser for electrical tomography systems.

Yin, W. and Dickinson, S. J. and Peyton, A. J. (2005) A multi-frequency impedance analyser for electrical tomography systems. In: Proceedings of the 4th world congress on industrial process tomography. UNSPECIFIED, pp. 30-35.

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Item Type:
Contribution in Book/Report/Proceedings
Uncontrolled Keywords:
/dk/atira/pure/researchoutput/libraryofcongress/ta
Subjects:
?? TA ENGINEERING (GENERAL). CIVIL ENGINEERING (GENERAL) ??
ID Code:
20098
Deposited By:
Deposited On:
10 Dec 2008 11:42
Refereed?:
No
Published?:
Published
Last Modified:
18 Sep 2023 02:24