Kormos, Judit and Sáfár, Anna (2008) Phonological short term-memory, working memory and foreign language performance in intensive language learning. Bilingualism: Language and Cognition, 11 (2). pp. 261-271. ISSN 1469-1841Full text not available from this repository.
In our research we addressed the question what the relationship is between phonological short-term and working memory capacity and performance in an end-of-year reading, writing, listening, speaking and use of English test. The participants of our study were 121 secondary school students aged 15–16 in the first intensive language training year of a bilingual education program in Hungary. The participants performed a non-word repetition test and took a Cambridge First Certificate Exam. Fifty students were also tested with a backward digit span test, measuring their working memory capacity. Our study indicates that phonological short-term memory capacity plays a different role in the case of beginners and pre-intermediate students in intensive language learning. The backward digit span test correlated very highly with the overall English language competence, as well as with reading, listening, speaking and use of English (vocabulary and grammar) test scores.
|Journal or Publication Title:||Bilingualism: Language and Cognition|
|Additional Information:||http://journals.cambridge.org/action/displayJournal?jid=UHY The final, definitive version of this article has been published in the Journal, Bilingualism : Language and Cognition, 11 (2), pp 261-271 2008, © 2008 Cambridge University Press.|
|Subjects:||P Language and Literature > P Philology. Linguistics|
|Departments:||Faculty of Arts & Social Sciences > Linguistics & English Language|
|Deposited By:||Dr Judit Kormos|
|Deposited On:||22 Feb 2008 09:43|
|Last Modified:||26 Sep 2016 00:00|
Actions (login required)